Coverart for item
The Resource A practical guide to transmission electron microscopy : fundamentals, Zhiping Luo, (electronic resource)

A practical guide to transmission electron microscopy : fundamentals, Zhiping Luo, (electronic resource)

Label
A practical guide to transmission electron microscopy : fundamentals
Title
A practical guide to transmission electron microscopy
Title remainder
fundamentals
Statement of responsibility
Zhiping Luo
Creator
Subject
Language
eng
Summary
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills
Member of
Cataloging source
CaBNVSL
http://library.link/vocab/creatorName
Luo, Zhiping
Dewey number
502.825
LC call number
QH212.T7
LC item number
L866 2016
Series statement
Materials characterization and analysis collection,
http://library.link/vocab/subjectName
Transmission electron microscopy
Label
A practical guide to transmission electron microscopy : fundamentals, Zhiping Luo, (electronic resource)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Contents
  • 1. Introduction -- 1.1 Microscope resolution -- 1.2 Interactions of electrons with specimen -- 1.3 Comparison of TEM with other microscopy techniques -- References --
  • 2. Sample preparation -- 2.1 Material samples -- 2.1.1 TEM grids -- 2.1.2 Ion milling -- 2.1.3 Electropolishing -- 2.1.4 Focused ion beam -- 2.1.5 Microtomy -- 2.2 Biological samples -- 2.2.1 Particulate samples -- 2.2.2 Cells and tissue samples -- References --
  • 3. Instrumentation and operation -- 3.1 Construction -- 3.1.1 Electron gun -- 3.1.2 Electromagnetic lens -- 3.1.3 Condenser lenses and condenser apertures -- 3.1.4 Objective lens and objective aperture -- 3.1.5 Intermediate lens and diffraction aperture -- 3.1.6 Projector lens -- 3.1.7 Viewing screen and camera -- 3.2 Instrument imperfections, alignments, corrections, and calibrations -- 3.2.1 Beam shift and beam tilt -- 3.2.2 Spherical aberration -- 3.2.3 Chromatic aberration -- 3.2.4 Depth of field and depth of focus -- 3.2.5 Specimen height -- 3.2.6 Astigmatism -- 3.2.7 Aperture alignment -- 3.2.8 Magnification calibration -- 3.2.9 Camera length calibration -- 3.2.10 Magnetic rotation calibration -- 3.3 TEM operating procedures -- 3.3.1 Startup -- 3.3.2 Specimen loading and unloading -- 3.3.3 Alignments -- 3.3.4 Data recording -- 3.3.5 Finishing -- References --
  • 4. Electron diffraction I -- 4.1 Formation of electron diffraction -- 4.2 Reciprocal space -- 4.3 Indexing of electron diffraction patterns -- 4.3.1 Indexing of powder patterns -- 4.3.2 Indexing of single-crystal diffraction patterns -- 4.3.3 Indexing of compound patterns: twins -- 4.3.4 Indexing of compound patterns: multiple phases -- 4.3.5 Indexing of compound patterns: double diffraction -- 4.4 Experimental procedures -- 4.5 Simulation of diffraction patterns -- References --
  • 5. Imaging I -- 5.1 Imaging contrast -- 5.2 Imaging with mass-thickness contrast -- 5.3 Imaging with diffraction contrast -- 5.3.1 Formation of diffraction contrast -- 5.3.2 Central dark-field imaging -- 5.3.3 Two-beam condition -- 5.3.4 Bragg-diffracted beam intensity -- 5.3.5 Thickness fringes -- 5.3.6 Bend contours -- 5.3.7 Weak-beam dark-field imaging -- 5.3.8 Planar defects -- 5.3.9 Dislocations -- References --
  • Appendices -- Appendix I. SAED indexing table of primitive cubic structure -- Appendix II. SAED indexing table of body-centered cubic structure -- Appendix III. SAED indexing table of face-centered cubic structure -- Appendix IV. SAED indexing table of close-packed hexagonal structure -- Illustration credits -- Index
Control code
OCM1bookssib024874820
Dimensions
unknown
Edition
First edition.
Extent
1 online resource (xiv, 152 pages)
Governing access note
License restrictions may limit access
Isbn
9781606507032
Other control number
10.5643/9781606507049
Other physical details
illustrations.
Specific material designation
remote
System control number
(WaSeSS)ssib024874820
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat reader
Label
A practical guide to transmission electron microscopy : fundamentals, Zhiping Luo, (electronic resource)
Publication
Bibliography note
Includes bibliographical references and index
Contents
  • 1. Introduction -- 1.1 Microscope resolution -- 1.2 Interactions of electrons with specimen -- 1.3 Comparison of TEM with other microscopy techniques -- References --
  • 2. Sample preparation -- 2.1 Material samples -- 2.1.1 TEM grids -- 2.1.2 Ion milling -- 2.1.3 Electropolishing -- 2.1.4 Focused ion beam -- 2.1.5 Microtomy -- 2.2 Biological samples -- 2.2.1 Particulate samples -- 2.2.2 Cells and tissue samples -- References --
  • 3. Instrumentation and operation -- 3.1 Construction -- 3.1.1 Electron gun -- 3.1.2 Electromagnetic lens -- 3.1.3 Condenser lenses and condenser apertures -- 3.1.4 Objective lens and objective aperture -- 3.1.5 Intermediate lens and diffraction aperture -- 3.1.6 Projector lens -- 3.1.7 Viewing screen and camera -- 3.2 Instrument imperfections, alignments, corrections, and calibrations -- 3.2.1 Beam shift and beam tilt -- 3.2.2 Spherical aberration -- 3.2.3 Chromatic aberration -- 3.2.4 Depth of field and depth of focus -- 3.2.5 Specimen height -- 3.2.6 Astigmatism -- 3.2.7 Aperture alignment -- 3.2.8 Magnification calibration -- 3.2.9 Camera length calibration -- 3.2.10 Magnetic rotation calibration -- 3.3 TEM operating procedures -- 3.3.1 Startup -- 3.3.2 Specimen loading and unloading -- 3.3.3 Alignments -- 3.3.4 Data recording -- 3.3.5 Finishing -- References --
  • 4. Electron diffraction I -- 4.1 Formation of electron diffraction -- 4.2 Reciprocal space -- 4.3 Indexing of electron diffraction patterns -- 4.3.1 Indexing of powder patterns -- 4.3.2 Indexing of single-crystal diffraction patterns -- 4.3.3 Indexing of compound patterns: twins -- 4.3.4 Indexing of compound patterns: multiple phases -- 4.3.5 Indexing of compound patterns: double diffraction -- 4.4 Experimental procedures -- 4.5 Simulation of diffraction patterns -- References --
  • 5. Imaging I -- 5.1 Imaging contrast -- 5.2 Imaging with mass-thickness contrast -- 5.3 Imaging with diffraction contrast -- 5.3.1 Formation of diffraction contrast -- 5.3.2 Central dark-field imaging -- 5.3.3 Two-beam condition -- 5.3.4 Bragg-diffracted beam intensity -- 5.3.5 Thickness fringes -- 5.3.6 Bend contours -- 5.3.7 Weak-beam dark-field imaging -- 5.3.8 Planar defects -- 5.3.9 Dislocations -- References --
  • Appendices -- Appendix I. SAED indexing table of primitive cubic structure -- Appendix II. SAED indexing table of body-centered cubic structure -- Appendix III. SAED indexing table of face-centered cubic structure -- Appendix IV. SAED indexing table of close-packed hexagonal structure -- Illustration credits -- Index
Control code
OCM1bookssib024874820
Dimensions
unknown
Edition
First edition.
Extent
1 online resource (xiv, 152 pages)
Governing access note
License restrictions may limit access
Isbn
9781606507032
Other control number
10.5643/9781606507049
Other physical details
illustrations.
Specific material designation
remote
System control number
(WaSeSS)ssib024874820
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat reader

Library Locations

    • Thomas Jefferson LibraryBorrow it
      1 University Blvd, St. Louis, MO, 63121, US
      38.710138 -90.311107
Processing Feedback ...