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The Resource A practical guide to transmission electron microscopy : Advanced microscopy, Volume II,, Zhiping Luo, (electronic resource)

A practical guide to transmission electron microscopy : Advanced microscopy, Volume II,, Zhiping Luo, (electronic resource)

Label
A practical guide to transmission electron microscopy : Advanced microscopy, Volume II,
Title
A practical guide to transmission electron microscopy
Title remainder
Advanced microscopy
Title number
Volume II,
Statement of responsibility
Zhiping Luo
Title variation
Advanced microscopy
Creator
Subject
Language
eng
Summary
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills
Member of
Cataloging source
CaBNVSL
http://library.link/vocab/creatorName
Luo, Zhiping
Dewey number
502.825
LC call number
QH212.T7
LC item number
L8662 2016
Series statement
Materials characterization and analysis collection,
http://library.link/vocab/subjectName
Transmission electron microscopy
Label
A practical guide to transmission electron microscopy : Advanced microscopy, Volume II,, Zhiping Luo, (electronic resource)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Contents
  • 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References --
  • 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References --
  • 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References --
  • 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index
Control code
OCM1bookssib024874819
Dimensions
unknown
Edition
First edition.
Extent
1 online resource (xiv, 155 pages)
Governing access note
License restrictions may limit access
Isbn
9781606509180
Other control number
10.5643/9781606509180
Other physical details
illustrations.
Specific material designation
remote
System control number
(WaSeSS)ssib024874819
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat reader
Label
A practical guide to transmission electron microscopy : Advanced microscopy, Volume II,, Zhiping Luo, (electronic resource)
Publication
Bibliography note
Includes bibliographical references and index
Contents
  • 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References --
  • 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References --
  • 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References --
  • 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index
Control code
OCM1bookssib024874819
Dimensions
unknown
Edition
First edition.
Extent
1 online resource (xiv, 155 pages)
Governing access note
License restrictions may limit access
Isbn
9781606509180
Other control number
10.5643/9781606509180
Other physical details
illustrations.
Specific material designation
remote
System control number
(WaSeSS)ssib024874819
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat reader

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