The Resource De-embedding method comparisons and physics based circuit model for high frequency D-probe, by Yuan Chen

De-embedding method comparisons and physics based circuit model for high frequency D-probe, by Yuan Chen

Label
De-embedding method comparisons and physics based circuit model for high frequency D-probe
Title
De-embedding method comparisons and physics based circuit model for high frequency D-probe
Statement of responsibility
by Yuan Chen
Creator
Author
Subject
Language
eng
Summary
"In section 1, the procedures of 1X-Reflect smart fixture de-embedding (SFD), 1-port auto fixture removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and de-embedded results. The accuracy of fixture characterization and the de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full wave models are built to evaluate the FOM of the three methods, by comparing the scattering parameters (S-parameters) and time domain reflectometer (TDR). A test coupon for measuring USB-C cables is adopted to serve as a manufactured validation purpose. In section 2, a physics-based circuit model for a novel differential probe without a nearby ground pin is built up to 20GHz. First, the SFD method is used to obtain the S-parameter of a differential probe in a full wave model to validate the effectiveness of this method. Second, real measurements are made to obtain the S-parameter of a differential probe. Furthermore, the one-to-one corresponding circuit model has been built to understand the physics of probes. A layout for the advance interconnect test tool (AITT) demo board is then designed to test probe characteristics and AITT software. Finally, the SFD method is applied to de-embed the test fixtures, and material information is extracted based on the de-embedded results"--Abstract, page iii
Member of
Cataloging source
UMR
http://library.link/vocab/creatorName
Chen, Yuan
Degree
M.S.
Dissertation year
2018
Granting institution
Missouri University of Science and Technology
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
  • theses
Label
De-embedding method comparisons and physics based circuit model for high frequency D-probe, by Yuan Chen
Instantiates
Publication
Note
Vita
Bibliography note
Includes bibliographic references (pages 47-50)
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
1041858149
Extent
1 online resource (ix, 51 pages)
Form of item
online
Governing access note
These materials are protected under copyright by the original author
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (chiefly color).
Specific material designation
remote
System control number
(OCoLC)1041858149
Label
De-embedding method comparisons and physics based circuit model for high frequency D-probe, by Yuan Chen
Publication
Note
Vita
Bibliography note
Includes bibliographic references (pages 47-50)
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
1041858149
Extent
1 online resource (ix, 51 pages)
Form of item
online
Governing access note
These materials are protected under copyright by the original author
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (chiefly color).
Specific material designation
remote
System control number
(OCoLC)1041858149

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