The Resource Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007) : characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland, (electronic resource)

Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007) : characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland, (electronic resource)

Label
Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007) : characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland
Title
Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007)
Title remainder
characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland
Title variation
  • EMAG 2007
  • Characterisation, manipulation and fabrication on the nanoscale
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
MUU
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://bibfra.me/vocab/lite/organizationDate
(2007 :
http://bibfra.me/vocab/lite/organizationName
Institute of Physics (Great Britain)
http://library.link/vocab/relatedWorkOrContributorName
Brown, Paul D
Series statement
Journal of Physics. Conference series,
Series volume
v. 126
http://library.link/vocab/subjectName
  • Electron microscopy
  • Nanostructured materials
Label
Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007) : characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland, (electronic resource)
Instantiates
Publication
Note
  • Title from table of contents screen (IOP, viewed May 19, 2009)
  • "The biennial conference of the Electron Microscopy & Analysis Group (EMAG) was this year held at Glasgow Caledonian University 5-7 September, whilst the EMAG Advanced School on 3-4 September was held at The University of Glasgow."--Preface
  • "Paul D. Brown ... (EMAG Proceedings Editor)"--Preface
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
EMAG 2007 -- Glimpsing order within the disarray -- A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices -- Analysis of hafnium containing powders and thin films for CMOS device applications -- Analysis of VEEL spectra of diamond using a dedicated STEM: isolation of Čerenkov loss contributions -- VEELS band gap measurements using monochromated electrons -- Structural characterisation of protein-caged iron minerals in biological systems -- Application of single particle analysis performed by SEM-EDX to air quality studies -- Identifying and quantifying the mechanism of electron beam induced damage and recovery in hydroxyapatite -- Analytical transmission electron microscopy of mineralised dentin -- Detailed TEM characterization of PbTiO3 nanorods -- Crystallographic mapping of ferroelectric thin films using piezoresponse force microscopy and electron backscatter diffraction -- Study of global and local crystallography at the domain boundaries of lead zirconate titanate piezoelectric ceramics -- Dislocation tomography made easy: a reconstruction from ADF STEM images obtained using automated image shift correction -- Dislocations in Pt8V ordered alloys -- Transmission electron microscopy characterization of NaAlH4 -- Electron tomography of CeO2 nanostructures -- Point-source holographic imaging of nanostructures and interfaces with low energy electrons -- Single atom electron energy-loss spectroscopy of implanted ions in carbon nanotubes -- Understanding the role of aluminium in low level nitrogen steels via microstructural characterisation -- The effect of crystallographic orientation on the mechanical properties of titanium -- EELS studies of nano-precipitates in borosilicate glasses -- Oxidation performance of nano-scale multilayer coatings on [gamma]-TiAl -- Structural stability of SiGe nanoparticles under 'in situ' electron beam irradiation in TEM -- Electron beam induced fabrication and characterization of nanostructures -- The nucleation stage in electron beam induced deposition -- Self-assembled growth of GaN nanowires -- Pattern formation in ultrathin polymer films prepared on microstructured surfaces -- Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument -- In-situ focused ion beam (FIB) microscopy at high temperature -- Oxford CyberSEM: remote microscopy -- Nanomanipulation and electrical behaviour of a single gold nanowire using in-situ SEM-FIB-nanomanipulators -- In-situ electrical characterisation of suspended multiwalled carbon nanotubes -- High resolution dopant profiling in the SEM, image widths and surface band-bending -- Aberration corrected TEM: current status and future prospects -- Dynamical and geometric effects in ptychographic diffractive imaging -- Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy -- Depth sectioning using electron energy loss spectroscopy -- Practical approaches to the accurate modelling of EELS edges using density functional theory -- Modelling paramagnetism in EELS: a study of magnetic order -- Improving EFTEM data using multivariate statistical analysis -- Quantitative measurements of phase using the transport of intensity equation -- Aberration corrected tilt series restoration -- Effects of diagnostic ionizing radiation on pregnancy via TEM -- 3D surface reconstruction and FIB microscopy of worn alumina hip prostheses -- EELS characterisation and valence determination of Mn minerals from the Kalahari manganese field in South Africa -- Dynamical 'in situ' observation of biological samples using variable pressure scanning electron microscope -- A cross-sectional transmission electron microscopy study of iron recovered from a laser-heated diamond anvil cell -- Microstructure of defects in InGaN/GaN quantum well heterostructures -- Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots -- Aberration corrected STEM of defects in epitaxial n=4 Ruddlesden-Popper phase Ca[subscript n+1]Mn[subscript n]O[subscript 3n+1] -- Microstructural studies of La[subscript 10.7]Ca[subscript 0.3]MnO3 (LCMO) films on different (110) substrates deposited by pulsed laser deposition -- Observations of flow in In[subscript x] Ga[subscript 1-x] As multilayers -- EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V MOSFET devices -- Grain contrast imaging in FIB and SEM -- Lorentz microscopy mapping during magnetization process of L10 FePd thin films -- Nanostructures of carbon in nuclear graphite -- Effect of microstructure of nano- and micro-particle filled polymer composites on their tribo-mechanical performance -- TEM characterization of a magnetic tunnel junction -- Manipulation of inverted and direct opals by a focused ion beam scanning electron microscope (FIB SEM) -- Sample preparation and electron microscopy of hydrocracking catalysts -- How the bond length can affect C70 DOS and EEL spectra -- Contrast of carbon in low-voltage electron microscopy: Monte-Carlo simulation -- Transition from quantitative to geometric tomography -- Heating and EELS experiments of CuAl reactive multilayers -- Magnetic properties of Fe-Ni nanoparticles prepared by co-precipitation method -- Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM -- Analysis of strain in manganese nanoparticles using the optical moiré technique -- Nano-scale analysis of titanium dioxide fingerprint-development powders -- Focused ion beam as tool for atomic force microscope (AFM) probes sculpturing -- Ni and W nanotips: fabrication and characterisation -- The microstructure origin of large strain plastically deformed SiC nanowires -- Characterisation of electron-beam deposited tungsten interconnects -- Micro- and nanomanipulation inside the SEM -- Thin foil analysis in the SEM -- Scanning electron microscopy analysis of sol-gel derived biocompatible glass -- Applications of environmental scanning electron microscopy (ESEM) in the study of novel drying latex films -- Novel characterization of stress corrosion cracks -- Developing dual beam methods for the study of polymers -- 3D tomographic analysis of crack morphologies in alumina and glass using FIB microscopy -- Semi-automated structural characterisation of high velocity oxy fuel thermally sprayed WC-Co based coatings -- Cassette-based in-situ TEM sample inspection in the dual-beam FIB -- Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope -- Characterisation of non-polar (11-20) gallium nitride using TEM techniques -- In situ TEM observation of solid-gas reactions -- Strain quantification in epitaxial thin films -- Spatially-resolved EEL studies of plasmons in silver filled carbon nanotubes using a dedicated STEM -- The function and benefits of a multifunctional heating holder developed for use with conventional high resolution analytical TEMs -- Can direct electron detectors outperform phosphor-CCD systems for TEM? -- A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis -- A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision -- STEM probe characteristics at large defoci for use in ptychographical imaging -- An optical demonstration of ptychographical imaging for focussed-probe illumination -- An energy stabilized post-column electron energy-loss spectrometer for transmission electron microscopy -- Characterising ambient and vacuum performance of a miniaturised TEM nanoindenter for in-situ material deformation -- Characterising performance of TEM compatible nanomanipulation slip-stick inertial sliders against gravity -- Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy -- AUTHOR INDEX -- SUBJECT INDEX
Control code
328650523
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
(OCoLC)328650523
Label
Electron Microscopy And Analysis Group Conference 2007 (EMAG 2007) : characterisation, manipulation and fabrication on the nanoscale: 3-7 September 2007, Glasgow Caledonian University & The University of Glasgow, Scotland, (electronic resource)
Publication
Note
  • Title from table of contents screen (IOP, viewed May 19, 2009)
  • "The biennial conference of the Electron Microscopy & Analysis Group (EMAG) was this year held at Glasgow Caledonian University 5-7 September, whilst the EMAG Advanced School on 3-4 September was held at The University of Glasgow."--Preface
  • "Paul D. Brown ... (EMAG Proceedings Editor)"--Preface
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
EMAG 2007 -- Glimpsing order within the disarray -- A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices -- Analysis of hafnium containing powders and thin films for CMOS device applications -- Analysis of VEEL spectra of diamond using a dedicated STEM: isolation of Čerenkov loss contributions -- VEELS band gap measurements using monochromated electrons -- Structural characterisation of protein-caged iron minerals in biological systems -- Application of single particle analysis performed by SEM-EDX to air quality studies -- Identifying and quantifying the mechanism of electron beam induced damage and recovery in hydroxyapatite -- Analytical transmission electron microscopy of mineralised dentin -- Detailed TEM characterization of PbTiO3 nanorods -- Crystallographic mapping of ferroelectric thin films using piezoresponse force microscopy and electron backscatter diffraction -- Study of global and local crystallography at the domain boundaries of lead zirconate titanate piezoelectric ceramics -- Dislocation tomography made easy: a reconstruction from ADF STEM images obtained using automated image shift correction -- Dislocations in Pt8V ordered alloys -- Transmission electron microscopy characterization of NaAlH4 -- Electron tomography of CeO2 nanostructures -- Point-source holographic imaging of nanostructures and interfaces with low energy electrons -- Single atom electron energy-loss spectroscopy of implanted ions in carbon nanotubes -- Understanding the role of aluminium in low level nitrogen steels via microstructural characterisation -- The effect of crystallographic orientation on the mechanical properties of titanium -- EELS studies of nano-precipitates in borosilicate glasses -- Oxidation performance of nano-scale multilayer coatings on [gamma]-TiAl -- Structural stability of SiGe nanoparticles under 'in situ' electron beam irradiation in TEM -- Electron beam induced fabrication and characterization of nanostructures -- The nucleation stage in electron beam induced deposition -- Self-assembled growth of GaN nanowires -- Pattern formation in ultrathin polymer films prepared on microstructured surfaces -- Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument -- In-situ focused ion beam (FIB) microscopy at high temperature -- Oxford CyberSEM: remote microscopy -- Nanomanipulation and electrical behaviour of a single gold nanowire using in-situ SEM-FIB-nanomanipulators -- In-situ electrical characterisation of suspended multiwalled carbon nanotubes -- High resolution dopant profiling in the SEM, image widths and surface band-bending -- Aberration corrected TEM: current status and future prospects -- Dynamical and geometric effects in ptychographic diffractive imaging -- Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy -- Depth sectioning using electron energy loss spectroscopy -- Practical approaches to the accurate modelling of EELS edges using density functional theory -- Modelling paramagnetism in EELS: a study of magnetic order -- Improving EFTEM data using multivariate statistical analysis -- Quantitative measurements of phase using the transport of intensity equation -- Aberration corrected tilt series restoration -- Effects of diagnostic ionizing radiation on pregnancy via TEM -- 3D surface reconstruction and FIB microscopy of worn alumina hip prostheses -- EELS characterisation and valence determination of Mn minerals from the Kalahari manganese field in South Africa -- Dynamical 'in situ' observation of biological samples using variable pressure scanning electron microscope -- A cross-sectional transmission electron microscopy study of iron recovered from a laser-heated diamond anvil cell -- Microstructure of defects in InGaN/GaN quantum well heterostructures -- Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots -- Aberration corrected STEM of defects in epitaxial n=4 Ruddlesden-Popper phase Ca[subscript n+1]Mn[subscript n]O[subscript 3n+1] -- Microstructural studies of La[subscript 10.7]Ca[subscript 0.3]MnO3 (LCMO) films on different (110) substrates deposited by pulsed laser deposition -- Observations of flow in In[subscript x] Ga[subscript 1-x] As multilayers -- EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V MOSFET devices -- Grain contrast imaging in FIB and SEM -- Lorentz microscopy mapping during magnetization process of L10 FePd thin films -- Nanostructures of carbon in nuclear graphite -- Effect of microstructure of nano- and micro-particle filled polymer composites on their tribo-mechanical performance -- TEM characterization of a magnetic tunnel junction -- Manipulation of inverted and direct opals by a focused ion beam scanning electron microscope (FIB SEM) -- Sample preparation and electron microscopy of hydrocracking catalysts -- How the bond length can affect C70 DOS and EEL spectra -- Contrast of carbon in low-voltage electron microscopy: Monte-Carlo simulation -- Transition from quantitative to geometric tomography -- Heating and EELS experiments of CuAl reactive multilayers -- Magnetic properties of Fe-Ni nanoparticles prepared by co-precipitation method -- Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM -- Analysis of strain in manganese nanoparticles using the optical moiré technique -- Nano-scale analysis of titanium dioxide fingerprint-development powders -- Focused ion beam as tool for atomic force microscope (AFM) probes sculpturing -- Ni and W nanotips: fabrication and characterisation -- The microstructure origin of large strain plastically deformed SiC nanowires -- Characterisation of electron-beam deposited tungsten interconnects -- Micro- and nanomanipulation inside the SEM -- Thin foil analysis in the SEM -- Scanning electron microscopy analysis of sol-gel derived biocompatible glass -- Applications of environmental scanning electron microscopy (ESEM) in the study of novel drying latex films -- Novel characterization of stress corrosion cracks -- Developing dual beam methods for the study of polymers -- 3D tomographic analysis of crack morphologies in alumina and glass using FIB microscopy -- Semi-automated structural characterisation of high velocity oxy fuel thermally sprayed WC-Co based coatings -- Cassette-based in-situ TEM sample inspection in the dual-beam FIB -- Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope -- Characterisation of non-polar (11-20) gallium nitride using TEM techniques -- In situ TEM observation of solid-gas reactions -- Strain quantification in epitaxial thin films -- Spatially-resolved EEL studies of plasmons in silver filled carbon nanotubes using a dedicated STEM -- The function and benefits of a multifunctional heating holder developed for use with conventional high resolution analytical TEMs -- Can direct electron detectors outperform phosphor-CCD systems for TEM? -- A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis -- A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision -- STEM probe characteristics at large defoci for use in ptychographical imaging -- An optical demonstration of ptychographical imaging for focussed-probe illumination -- An energy stabilized post-column electron energy-loss spectrometer for transmission electron microscopy -- Characterising ambient and vacuum performance of a miniaturised TEM nanoindenter for in-situ material deformation -- Characterising performance of TEM compatible nanomanipulation slip-stick inertial sliders against gravity -- Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy -- AUTHOR INDEX -- SUBJECT INDEX
Control code
328650523
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
(OCoLC)328650523

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