Coverart for item
The Resource Electron microscopy XIV : selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland, edited by Danuta Stróż and Krystian Prusik

Electron microscopy XIV : selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland, edited by Danuta Stróż and Krystian Prusik

Label
Electron microscopy XIV : selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland
Title
Electron microscopy XIV
Title remainder
selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland
Statement of responsibility
edited by Danuta Stróż and Krystian Prusik
Title variation
Electron microscopy 14
Creator
Contributor
Editor
Subject
Genre
Language
eng
Summary
These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines
Member of
Cataloging source
N$T
Dewey number
502.825
Illustrations
illustrations
Index
index present
LC call number
QH212.E4
LC item number
E365 2011eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2011
http://bibfra.me/vocab/lite/meetingName
International Conference on Electron Microscopy
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Stróż, Danuta
  • Prusik, Krystian
Series statement
Solid state phenomena,
Series volume
vol. 186
http://library.link/vocab/subjectName
  • Electron microscopy
  • SCIENCE
  • Electron microscopy
Label
Electron microscopy XIV : selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland, edited by Danuta Stróż and Krystian Prusik
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Electron Microscopy XIV; Preface and Conference Photo; Table of Contents; Methods of Electron Crystallography as Tools for Materials Analysis; Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films; Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science; The Art and Application of Large Angle Convergent Beam Electron Diffraction; Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM; Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM
  • A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food SupplementsPhysical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy; 3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography; 3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography; Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography
  • Martensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSDInvestigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope; Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM; High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions -- A few Practical Remarks; Study of Silicon Nanoparticles Formation in Silicon Nitride; Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam Epitaxy
  • Crystallographic Aspects of Deformation and Recrystallization in ECAP-Processed AA3104 Aluminium AlloyMicrostructure of the Ni-W Solid Solution Prepared by Levitation and after High Pressure Torsion Severe Plastic Deformation; Near Grain Boundary Behavior of Aluminum Bicrystals Deformed in Plane Strain Conditions; Microstructure and Texture Evolutions in AA1200 Aluminum Alloy Deformed by Accumulative Roll Bonding Method; Gradient Microstructure of FeCr30Co8 Hard Magnetic Alloy Subjected to Plastic Deformation by Tension Combined with Torsion at 700 and 720°C
Control code
840106053
Dimensions
unknown
Extent
1 online resource (xiii, 346 pages)
File format
unknown
Form of item
online
Isbn
9783038136996
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations (some color)
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)840106053
Label
Electron microscopy XIV : selected, peer-reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla Poland, edited by Danuta Stróż and Krystian Prusik
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and indexes
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Electron Microscopy XIV; Preface and Conference Photo; Table of Contents; Methods of Electron Crystallography as Tools for Materials Analysis; Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films; Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science; The Art and Application of Large Angle Convergent Beam Electron Diffraction; Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM; Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM
  • A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food SupplementsPhysical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy; 3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography; 3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography; Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography
  • Martensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSDInvestigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope; Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM; High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions -- A few Practical Remarks; Study of Silicon Nanoparticles Formation in Silicon Nitride; Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam Epitaxy
  • Crystallographic Aspects of Deformation and Recrystallization in ECAP-Processed AA3104 Aluminium AlloyMicrostructure of the Ni-W Solid Solution Prepared by Levitation and after High Pressure Torsion Severe Plastic Deformation; Near Grain Boundary Behavior of Aluminum Bicrystals Deformed in Plane Strain Conditions; Microstructure and Texture Evolutions in AA1200 Aluminum Alloy Deformed by Accumulative Roll Bonding Method; Gradient Microstructure of FeCr30Co8 Hard Magnetic Alloy Subjected to Plastic Deformation by Tension Combined with Torsion at 700 and 720°C
Control code
840106053
Dimensions
unknown
Extent
1 online resource (xiii, 346 pages)
File format
unknown
Form of item
online
Isbn
9783038136996
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations (some color)
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)840106053

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