Coverart for item
The Resource Electron microscopy and analysis, Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK

Electron microscopy and analysis, Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK

Label
Electron microscopy and analysis
Title
Electron microscopy and analysis
Statement of responsibility
Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK
Creator
Contributor
Author
Subject
Language
eng
Summary
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context
Cataloging source
N$T
http://library.link/vocab/creatorName
Goodhew, Peter J
Dewey number
502/.8/25
Illustrations
illustrations
Index
index present
LC call number
QH212.E4
LC item number
G62 2017
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Humphreys, F. J.
  • Beanland, R.
http://library.link/vocab/subjectName
  • Electron microscopy
  • SCIENCE / General
  • Electron microscopy
Label
Electron microscopy and analysis, Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques
Control code
1035158181
Dimensions
unknown
Edition
Third edition.
Extent
1 online resource (x, 251 pages)
Form of item
online
Isbn
9781420017250
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
(OCoLC)1035158181
Label
Electron microscopy and analysis, Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques
Control code
1035158181
Dimensions
unknown
Edition
Third edition.
Extent
1 online resource (x, 251 pages)
Form of item
online
Isbn
9781420017250
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
(OCoLC)1035158181

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      38.710138 -90.311107
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