The Resource Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass, Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze

Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass, Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze

Label
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass
Title
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass
Statement of responsibility
Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorName
Juhasz, Albert J
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Tew, Roy C
  • Schwarze, Gene E
  • Lewis Research Center
Series statement
NASA technical memorandum
Series volume
NASA/TM-1998-208826
http://library.link/vocab/subjectName
  • Operating temperature
  • Radiation hardening
  • Silicon carbides
  • Spacecraft power supplies
  • Heat radiators
  • Radiation effects
Label
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass, Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze
Instantiates
Publication
Note
Shipping list no.: 99-0559-M
Base of film
safety base undetermined
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
41584954
Dimensions
4x6 in. or 11x15 cm.
Extent
1 volume.
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
http://library.link/vocab/ext/overdrive/overdriveId
19990018836
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
Label
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass, Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze
Publication
Note
Shipping list no.: 99-0559-M
Base of film
safety base undetermined
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
41584954
Dimensions
4x6 in. or 11x15 cm.
Extent
1 volume.
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
http://library.link/vocab/ext/overdrive/overdriveId
19990018836
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche

Library Locations

    • Thomas Jefferson LibraryBorrow it
      1 University Blvd, St. Louis, MO, 63121, US
      38.710138 -90.311107
Processing Feedback ...