Coverart for item
The Resource On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys, Kazuo Nagata and Seiichi Nishikawa, (microform)

On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys, Kazuo Nagata and Seiichi Nishikawa, (microform)

Label
On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys
Title
On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys
Statement of responsibility
Kazuo Nagata and Seiichi Nishikawa
Creator
Contributor
Subject
Genre
Language
  • eng
  • jpn
  • eng
Member of
Cataloging source
FLT
http://library.link/vocab/creatorName
Nagata, Kazuo
Funding information
NASA, Lewis Research Center.
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • bibliography
  • technical reports
http://library.link/vocab/relatedWorkOrContributorName
  • Nishikawa, Seiichi
  • United States
Series statement
NASA technical translation
Series volume
NASA TT-20183
http://library.link/vocab/subjectName
Iron-copper alloys
Label
On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys, Kazuo Nagata and Seiichi Nishikawa, (microform)
Instantiates
Publication
Note
  • Cover title
  • "Transl. of 'Cu-0.52 wt % Fe gōkin jikō shoki ni okeru hiteikō zōka oyobi Cu-Fe gōkin jikōzai no sosei kakō ni yoru ijō denki teikō zōka ni tsuite', Seisan kenkyu, vol. 25, no. 7, 1973, pp. 288-293."
  • Distributed to depository libraries in microfiche
  • "June 1988."
Bibliography note
Includes bibliographical references (page 11)
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
21013174
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
11 pages
Form of item
microfiche
Generation
first generation master
Lccn
lum95042503
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
n 88-24869
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
System control number
(WaOLN)1668857
Label
On the abnormal phenomena observed in the electrical resistivity measurement during the decomposition process of saturated Cu-Fe alloys, Kazuo Nagata and Seiichi Nishikawa, (microform)
Publication
Note
  • Cover title
  • "Transl. of 'Cu-0.52 wt % Fe gōkin jikō shoki ni okeru hiteikō zōka oyobi Cu-Fe gōkin jikōzai no sosei kakō ni yoru ijō denki teikō zōka ni tsuite', Seisan kenkyu, vol. 25, no. 7, 1973, pp. 288-293."
  • Distributed to depository libraries in microfiche
  • "June 1988."
Bibliography note
Includes bibliographical references (page 11)
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
21013174
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
11 pages
Form of item
microfiche
Generation
first generation master
Lccn
lum95042503
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
n 88-24869
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
System control number
(WaOLN)1668857

Library Locations

    • Thomas Jefferson LibraryBorrow it
      1 University Blvd, St. Louis, MO, 63121, US
      38.710138 -90.311107
Processing Feedback ...