Coverart for item
The Resource Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)

Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)

Label
Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania
Title
Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania
Statement of responsibility
edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
CPJP
Dewey number
006.4/2
LC call number
TA1634
LC item number
.C33 1994
http://bibfra.me/vocab/lite/meetingDate
1994
http://bibfra.me/vocab/lite/meetingName
CAD-Based Vision Workshop
http://library.link/vocab/relatedWorkOrContributorName
  • Kak, Avinash C
  • Ikeuchi, Katsushi
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Computer vision
  • Computer-aided design
Label
Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
Instantiates
Publication
Note
"IEEE Catalog Number 94TH0595-9."
Bibliography note
Includes bibliographical references and author index
Control code
OCM1bookssj0000445287
Dimensions
29 cm.
Dimensions
unknown
Extent
ix, 307 pages
Isbn
9780818653100
Isbn Type
(paper)
Lccn
93080368
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000445287
Label
Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
Publication
Note
"IEEE Catalog Number 94TH0595-9."
Bibliography note
Includes bibliographical references and author index
Control code
OCM1bookssj0000445287
Dimensions
29 cm.
Dimensions
unknown
Extent
ix, 307 pages
Isbn
9780818653100
Isbn Type
(paper)
Lccn
93080368
Other physical details
illustrations
Specific material designation
remote
System control number
(WaSeSS)ssj0000445287

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