Coverart for item
The Resource SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)

SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)

Label
SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
Title
SIGMETRICS 2005
Title remainder
International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
Statement of responsibility
sponsored by ACM SIGMETRICS
Title variation
  • Special Interest Group on Measurement and Evaluation 2005
  • Proceedings of the 2005 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
  • SIGMETRICS '05
  • ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, Banff, AB, Canada - June 06 - 10, 2005
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
WaSeSS
LC call number
TK5105.5
http://bibfra.me/vocab/lite/meetingDate
2005
http://bibfra.me/vocab/lite/meetingName
International Conference on Measurement and Modeling of Computer Systems
http://library.link/vocab/relatedWorkOrContributorName
  • ACM-Sigmetrics
  • ACM Digital Library
http://library.link/vocab/subjectName
  • Computer networks
  • Electronic digital computers
Label
SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
Instantiates
Publication
Note
Includes index
Control code
OCM1bookssj0001139305
Dimensions
unknown
Isbn
9781595930224
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)bookssj0001139305
Label
SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
Publication
Note
Includes index
Control code
OCM1bookssj0001139305
Dimensions
unknown
Isbn
9781595930224
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)bookssj0001139305

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