The Resource SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
Resource Information
The item SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri-St. Louis Libraries.This item is available to borrow from 1 library branch.
Resource Information
The item SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Missouri-St. Louis Libraries.
This item is available to borrow from 1 library branch.
- Language
- eng
- Label
- SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
- Title
- SIGMETRICS 2005
- Title remainder
- International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
- Statement of responsibility
- sponsored by ACM SIGMETRICS
- Title variation
-
- Special Interest Group on Measurement and Evaluation 2005
- Proceedings of the 2005 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
- SIGMETRICS '05
- ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, Banff, AB, Canada - June 06 - 10, 2005
- Language
- eng
- Cataloging source
- WaSeSS
- LC call number
- TK5105.5
- http://bibfra.me/vocab/lite/meetingDate
- 2005
- http://bibfra.me/vocab/lite/meetingName
- International Conference on Measurement and Modeling of Computer Systems
- http://library.link/vocab/relatedWorkOrContributorName
-
- ACM-Sigmetrics
- ACM Digital Library
- http://library.link/vocab/subjectName
-
- Computer networks
- Electronic digital computers
- Label
- SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
- Note
- Includes index
- Control code
- OCM1bookssj0001139305
- Dimensions
- unknown
- Isbn
- 9781595930224
- Isbn Type
- (print)
- Specific material designation
- remote
- System control number
- (WaSeSS)bookssj0001139305
- Label
- SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)
- Note
- Includes index
- Control code
- OCM1bookssj0001139305
- Dimensions
- unknown
- Isbn
- 9781595930224
- Isbn Type
- (print)
- Specific material designation
- remote
- System control number
- (WaSeSS)bookssj0001139305
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.umsl.edu/portal/SIGMETRICS-2005--International-Conference-on/0rvFtDshVjw/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.umsl.edu/portal/SIGMETRICS-2005--International-Conference-on/0rvFtDshVjw/">SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.umsl.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.umsl.edu/">University of Missouri-St. Louis Libraries</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.umsl.edu/portal/SIGMETRICS-2005--International-Conference-on/0rvFtDshVjw/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.umsl.edu/portal/SIGMETRICS-2005--International-Conference-on/0rvFtDshVjw/">SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada, sponsored by ACM SIGMETRICS, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.umsl.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.umsl.edu/">University of Missouri-St. Louis Libraries</a></span></span></span></span></div>
