The Resource Surface roughness due to residual ice in the use of low power deicing systems, Jaiwon Shin and Thomas H. Bond, (microform)

Surface roughness due to residual ice in the use of low power deicing systems, Jaiwon Shin and Thomas H. Bond, (microform)

Label
Surface roughness due to residual ice in the use of low power deicing systems
Title
Surface roughness due to residual ice in the use of low power deicing systems
Statement of responsibility
Jaiwon Shin and Thomas H. Bond
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorName
Shin, Jaiwon
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • bibliography
  • technical reports
http://library.link/vocab/relatedWorkOrContributorName
  • Bond, Thomas H
  • United States
Series statement
NASA technical memorandum
Series volume
105971
http://library.link/vocab/subjectName
  • Airplanes
  • Deicing chemicals
  • Drag (Aerodynamics)
Label
Surface roughness due to residual ice in the use of low power deicing systems, Jaiwon Shin and Thomas H. Bond, (microform)
Instantiates
Publication
Note
  • Cover title
  • Prepared for the 31st Aerospace Sciences Meeting & Exhibit sponsored by the American Institute of Aeronautics and Astronautics, Reno, Nev., Jan. 11-14, 1993
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 93-0436-M
  • "AIAA-93-0031."
Bibliography note
Includes bibliographical references (pages 7-8)
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
30565015
Dimensions
28 cm
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
14 pages
Form of item
microfiche
Generation
first generation master
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
System control number
(WaOLN)1582470
Label
Surface roughness due to residual ice in the use of low power deicing systems, Jaiwon Shin and Thomas H. Bond, (microform)
Publication
Note
  • Cover title
  • Prepared for the 31st Aerospace Sciences Meeting & Exhibit sponsored by the American Institute of Aeronautics and Astronautics, Reno, Nev., Jan. 11-14, 1993
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 93-0436-M
  • "AIAA-93-0031."
Bibliography note
Includes bibliographical references (pages 7-8)
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
30565015
Dimensions
28 cm
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
14 pages
Form of item
microfiche
Generation
first generation master
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
System control number
(WaOLN)1582470

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      38.710138 -90.311107
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