The Resource The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, J.R. Ehrstein, M.C. Croarkin, (microform)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, J.R. Ehrstein, M.C. Croarkin, (microform)

Label
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Title
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Statement of responsibility
J.R. Ehrstein, M.C. Croarkin
Title variation
Certification of one hundred mm diameter silicon resistivity SRMs ..
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GAO
http://library.link/vocab/creatorName
Ehrstein, James R
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1934-
http://library.link/vocab/relatedWorkOrContributorName
  • Croarkin, M. C.
  • National Institute of Standards and Technology (U.S.)
Series statement
  • Standard reference materials
  • NIST special publication
Series volume
260-131
http://library.link/vocab/subjectName
  • Silicon
  • Silicon
Label
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, J.R. Ehrstein, M.C. Croarkin, (microform)
Instantiates
Publication
Note
  • Shipping list no.: 98-0569-M
  • "August 1997."
Base of film
safety base undetermined
Bibliography note
Includes bibliographical references
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
39138544
Dimensions
28 cm
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
xv, 84 pages
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
003-003-03495-9
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
Label
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, J.R. Ehrstein, M.C. Croarkin, (microform)
Publication
Note
  • Shipping list no.: 98-0569-M
  • "August 1997."
Base of film
safety base undetermined
Bibliography note
Includes bibliographical references
Carrier category
microfiche
Carrier category code
  • he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
39138544
Dimensions
28 cm
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
xv, 84 pages
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
  • h
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
003-003-03495-9
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche

Library Locations

    • Thomas Jefferson LibraryBorrow it
      1 University Blvd, St. Louis, MO, 63121, US
      38.710138 -90.311107
Processing Feedback ...