Coverart for item
The Resource VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007, edited by William Ribarsky, John Dill, (electronic resource)

VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007, edited by William Ribarsky, John Dill, (electronic resource)

Label
VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007
Title
VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007
Title remainder
proceedings, Sacramento, California, USA, October 30-November 1, 2007
Statement of responsibility
edited by William Ribarsky, John Dill
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
DLC
Dewey number
006.6
LC call number
QA76.9.C65
LC item number
I367 2007
http://bibfra.me/vocab/lite/meetingDate
2007
http://bibfra.me/vocab/lite/meetingName
IEEE Symposium on Visual Analytics Science and Technology
http://library.link/vocab/relatedWorkOrContributorDate
1939-
http://library.link/vocab/relatedWorkOrContributorName
  • Ribarsky, William
  • Dill, John
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Digital computer simulation
  • Visual analytics
  • Information visualization
  • Computer graphics
Label
VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007, edited by William Ribarsky, John Dill, (electronic resource)
Instantiates
Publication
Note
"Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee."
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000527273
Dimensions
28 cm.
Dimensions
unknown
Extent
x, 246 pages
Isbn
9781424416592
Lccn
2009417581
Other physical details
chiefly col. ill., color maps
Specific material designation
remote
System control number
(WaSeSS)ssj0000527273
Label
VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007, edited by William Ribarsky, John Dill, (electronic resource)
Publication
Note
"Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee."
Bibliography note
Includes bibliographical references and index
Control code
OCM1bookssj0000527273
Dimensions
28 cm.
Dimensions
unknown
Extent
x, 246 pages
Isbn
9781424416592
Lccn
2009417581
Other physical details
chiefly col. ill., color maps
Specific material designation
remote
System control number
(WaSeSS)ssj0000527273

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