Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
Resource Information
The instance Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource) represents a material embodiment of a distinct intellectual or artistic creation found in University of Missouri-St. Louis Libraries. This resource is a combination of several types including: Instance, Electronic.
The Resource
Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
Resource Information
The instance Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource) represents a material embodiment of a distinct intellectual or artistic creation found in University of Missouri-St. Louis Libraries. This resource is a combination of several types including: Instance, Electronic.
- Label
- Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
- Medium
- electronic resource
- Statement of responsibility
- edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence
- Note
- "IEEE Catalog Number 94TH0595-9."
- Bibliography note
- Includes bibliographical references and author index
- Control code
- OCM1bookssj0000445287
- Dimensions
- 29 cm.
- Dimensions
- unknown
- Extent
- ix, 307 pages
- Isbn
- 9780818653100
- Isbn Type
- (paper)
- Lccn
- 93080368
- Other physical details
- illustrations
- Record ID
- .b97553311
- Specific material designation
- remote
- System control number
- (WaSeSS)ssj0000445287
Context
Context of Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)Embed
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Data Citation of the Instance Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.umsl.edu/resource/vBM_2AMEzbk/" typeof="Book http://bibfra.me/vocab/lite/Instance"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.umsl.edu/resource/vBM_2AMEzbk/">Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania, edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.umsl.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.umsl.edu/">University of Missouri-St. Louis Libraries</a></span></span></span></span></div>
